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Advanced Materials Characterization

Advanced Materials Characterization

Basic Principles, Novel Applications, and Future Directions

Inhalt

The book covers various methods of characterization of advanced materials commonly used in engineering including understanding of the working principle and applicability of devices. Major instruments covered include X-Ray Diffraction, NSOM Raman, X-Ray Photo Spectroscopy, UV-VIS- NIR Spectrosphotometer, FTIR Spectroscopy, and so forth.

Bibliografische Angaben

Mai 2023, 130 Seiten, Advanced Materials Processing and Manufacturing, Englisch
Taylor and Francis
978-1-03-237510-6

Inhaltsverzeichnis

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Weitere Titel der Reihe: Advanced Materials Processing and Manufacturing

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