This book is the first comprehensive study of fault-tolerance and fault-caused deadlock effects in asynchronous on-chip networks, aiming to overcome these drawbacks and ensure greater reliability of applications.
Bibliografische Angaben
Mai 2024, 362 Seiten, Englisch
Taylor and Francis
978-1-03-225741-9
Inhaltsverzeichnis
Schlagworte
Inhalt
This book is the first comprehensive study of fault-tolerance and fault-caused deadlock effects in asynchronous on-chip networks, aiming to overcome these drawbacks and ensure greater reliability of applications.