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Advanced Materials Characterization

Advanced Materials Characterization

Basic Principles, Novel Applications, and Future Directions

The book covers various methods of characterization of advanced materials commonly used in engineering including understanding of the working principle and applicability of devices. Major instruments covered include X-Ray Diffraction, NSOM Raman, X-Ray Photo Spectroscopy, UV-VIS- NIR Spectrosphotometer, FTIR Spectroscopy, and so forth.

novembre 2024, env. 130 pages, Advanced Materials Processing and Manufacturing, Anglais
Taylor and Francis
978-1-032-37511-3

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